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Authors: Andreas Vetter, Raoul Kirner, Toralf Scharf, Wilfried Noell, Carsten Rockstuhl, Reinhard Voelkel
Journal title: 2018 International Conference on Optical MEMS and Nanophotonics (OMN)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-5
DOI identifier: 10.1109/omn.2018.8454655
ISBN: 978-1-5090-6374-1
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