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Authors: Rachel Leuthold, Jochem De Schutter, Elena C. Malz, Giovanni Licitra, Sebastien Gros, Moritz Diehl
Journal title: 2018 European Control Conference (ECC)
Journal publisher: IEEE
Published year: 2018
Published pages: 52-57
DOI identifier: 10.23919/ecc.2018.8550199
ISBN: 978-3-9524-2698-2