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Authors: C.M. Hackl, M.J. Kamper, J. Kullick, J. Mitchell
Journal title: 2016 IEEE 25th International Symposium on Industrial Electronics (ISIE)
Journal publisher: IEEE
Published year: 2016
Published pages: 153-160
DOI identifier: 10.1109/ISIE.2016.7744882
ISBN: 978-1-5090-0873-5