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Authors: Robin Verschueren, Niels van Duijkeren, Jan Swevers, Moritz Diehl
Journal title: 2016 American Control Conference (ACC)
Journal publisher: IEEE
Published year: 2016
Published pages: 2092-2097
DOI identifier: 10.1109/ACC.2016.7525227
ISBN: 978-1-4673-8682-1