Summary
Despite the importance of chirally pure crystalline products, there is no Process Analytical Tool (PAT) that can monitor the enantiomeric excess in the crystalline phase of a suspension during a resolution process. However, PAT are of key importance, particularly in the move towards continuous manufacturing as they will enable appropriate control of the processes, but also in batch processes relying on decracemization where detecting the endpoint can be achieved. ESR14 will develop a tool based on chiroptical spectroscopy and Second Harmonic Generation.
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