Ab initio quantum transport simulations of defective devices based on 2-D materials via a projected-GW approach

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Authors: G. Gandus; J. Cao; T. Agarwal; M. Luisier; Y. Lee

Journal title: 2022 International Electron Devices Meeting (IEDM)

Journal number: 2022

Journal publisher: IEEE

Published year: 2022

Published pages: 10019510

DOI identifier: 10.1109/iedm45625.2022.10019510

ISBN: 978-1-6654-8959-1