X-ray ptychographic topography: A robust nondestructive tool for strain imaging

Summary

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Authors: Mariana Verezhak, Steven Van Petegem, Angel Rodriguez-Fernandez, Pierre Godard, Klaus Wakonig, Dmitry Karpov, Vincent L. R. Jacques, Andreas Menzel, Ludovic Thilly, Ana Diaz

Journal title: Physical Review B

Journal number: 103/14

Journal publisher: APS

Published year: 2021

DOI identifier: 10.1103/physrevb.103.144107

ISSN: 2469-9950