High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development

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Authors: Benedikt Rösner, Florian Döring, Primož R. Ribič, David Gauthier, Emiliano Principi, Claudio Masciovecchio, Marco Zangrando, Joan Vila-Comamala, Giovanni De Ninno, Christian David

Journal title: Optics Express

Journal number: 25/24

Journal publisher: Optical Society of America

Published year: 2017

Published pages: 30686

DOI identifier: 10.1364/OE.25.030686

ISSN: 1094-4087