Visualization of Crystallographic Defects in InSb Micropillars by Ptychographic Topography

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Authors: Mariana Verezhak, Steven Van Petegem, Vincent Jacques, Pierre Godard, Klaus Wakonig, Ludovic Thilly, Ana Diaz

Journal title: Microscopy and Microanalysis

Journal number: 24/S2

Journal publisher: Cambridge University Press

Published year: 2018

Published pages: 18-21

DOI identifier: 10.1017/S1431927618012527

ISSN: 1431-9276