7 nm Spatial Resolution in Soft X-ray Microscopy

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Authors: Benedikt Rösner, Frieder Koch, Florian Döring, Vitaliy A. Guzenko, Markus Meyer, Joshua L. Ornelas, Andreas Späth, Rainer H. Fink, Stefan Stanescu, Sufal Swaraj, Rachid Belkhou, Benjamin Watts, Jörg Raabe, Christian David

Journal title: Microscopy and Microanalysis

Journal number: 24/S2

Journal publisher: Cambridge University Press

Published year: 2018

Published pages: 272-273

DOI identifier: 10.1017/s1431927618013697

ISSN: 1431-9276