ID-Full Field Microscopy of Elastic and Inelastic Scattering with Transmission off-axis Fresnel Zone Plates

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Authors: F. Poring, F. Marschall, Z. Yin, B. Rosner, M. Beye, P. Miedema, K. Kubicek, L. Glaser, D. Raiser, J. Soltau, V.A. Guzenko, J. Viefhaus, J. Buck, M. Risch, S. Techert, C. David

Journal title: Microscopy and Microanalysis

Journal number: 24/S2

Journal publisher: Cambridge University Press

Published year: 2018

Published pages: 184-185

DOI identifier: 10.1017/s1431927618013260

ISSN: 1431-9276