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Authors: Saeedi, Sepide; Carpegna, Alessio; Savino, Alessandro; Di Carlo, Stefano
Journal title: 2022 IEEE 23rd Latin American Test Symposium (LATS)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/LATS57337.2022.9936999
ISBN: 978-1-6654-5707-1