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Authors: Ali Piri; Sepide Saeedi; Mario Barbareschi; Bastien Deveautour; Stefano Di Carlo; Ian O'Connor; Alessandro Savino; Marcello Traiola; Alberto Bosio
Journal title: 2022 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/aqtr55203.2022.9801944
ISBN: 978-1-6654-7933-2
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