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Authors: Xuqiang Zheng, Chun Zhang, Fangxu Lv, Feng Zhao, Shigang Yue, Ziqiang Wang, Fule Li, Zhihua Wang
Journal title: ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference
Journal publisher: IEEE
Published year: 2016
Published pages: 305-308
DOI identifier: 10.1109/ESSCIRC.2016.7598303
ISBN: 978-1-5090-2972-3