A 14-bit 250 MS/s IF Sampling Pipelined ADC in 180 nm CMOS Process

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Authors: Xuqiang Zheng, Zhijun Wang, Fule Li, Feng Zhao, Shigang Yue, Chun Zhang, Zhihua Wang

Journal title: IEEE Transactions on Circuits and Systems I: Regular Papers

Journal number: 63/9

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2016

Published pages: 1381-1392

DOI identifier: 10.1109/TCSI.2016.2580703

ISSN: 1549-8328