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Authors: Matthijs T. J. Spaan; Pavol Bauer; Claudio A. Canizares; Thiago Batista Soeiro; Dario Chaifouroosh; Laura Ramirez-Elizondo; Nils H. van der Blij
Journal title: ISIE 2020
Journal number: 1
Journal publisher: IEEE
Published year: 2020
DOI identifier: 10.5281/zenodo.3906534
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