“I Am Told to Be Happy”: An Exploration of Deep Learning in Affective Colormaps in Industrial Tomography

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Authors: Yuchong Zhang, Morten Fjeld

Journal title: 2021 2nd International Conference on Artificial Intelligence and Information Systems

Journal number: 28-30 May 2021

Journal publisher: ACM

Published year: 2021

Published pages: 1-5

DOI identifier: 10.1145/3469213.3469220

ISBN: 9781450390200