Condition Monitoring for Confined Industrial Process Based on Infrared Images by Using Deep Neural Network and Variants

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Authors: Yuchong Zhang, Morten Fjeld

Journal title: Proceedings of the 2020 2nd International Conference on Image, Video and Signal Processing

Journal publisher: ACM

Published year: 2020

Published pages: 99-106

DOI identifier: 10.1145/3388818.3388823

ISBN: 9781-450376952