Beam Intensity Monitoring with nanoampere resolution - the cryogenic current comparator (CCC)

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Authors: D.M. Haider, P. Forcj, F. Kurian, M. Schwickert, T. Seiber. M. Fernandes, J. Tan, J. Golm, F. Schmidl, P. Seidel, T. Stoehlker, V. Tympel, M. Schmelz, R. Stolz, V. Zakosarenko, H. De Gersem, N. Marsic

Journal title: 7th International beam Instrumentation Conference

Journal publisher: JACoW Publishing

Published year: 2018

DOI identifier: 10.18429/jacow-ibic2018-mopc08