Single-pass non-destructive electronic detection of charged particles

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Authors: Markus Kiffer, Stefan Ringleb, Nils Stallkamp, Béla Arndt, Ilya Blinov, Sugam Kumar, Stefan Stahl, Thomas Stöhlker, Manuel Vogel

Journal title: Review of Scientific Instruments

Journal number: 90/11

Journal publisher: American Institute of Physics

Published year: 2019

Published pages: 113301

DOI identifier: 10.1063/1.5110988

ISSN: 0034-6748