Abstract 'Deep learning based missing wedge artefact removal for electron tomography'

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Authors: J. Rimpeläinen, S. Bazrafkan, J. Sijbers, J. De Beenhouwer

Journal title: (2019) MC 2019 Berlin Microscopy Conference - Abstracts. Regensburg - IM7.004

Journal publisher: Deutsche Gesellschaft fur elektronenmikroskopie

Published year: 2019

Published pages: 660-661