Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning

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Authors: Coban, Sophia Bethany; Andriiashen, Vladyslav; Ganguly, Poulami Somanya; van Eijnatten, Maureen; Batenburg, Kees Joost

Journal publisher: Leiden Institute of Advanced Computer Science

Published year: 2020

DOI identifier: 10.48550/arxiv.2012.13346