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Authors: Giacomo Iadarola, Fabio Martinelli, Francesco Mercaldo, Antonella Santone
Journal title: 2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)
Journal publisher: IEEE
Published year: 2020
Published pages: 255-260
DOI identifier: 10.1109/issrew51248.2020.00082
ISBN: 978-1-7281-7735-9