Logic Gates Based on Synthetic Antiferromagnetic Bilayer Skyrmions

Summary

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Authors: Mouad Fattouhi, Kai Yu Mak, Yan Zhou, Xichao Zhang, Xiaoxi Liu, Mohamed El Hafidi

Journal title: Physical Review Applied

Journal number: 16/1

Journal publisher: American Physical Society

Published year: 2021

DOI identifier: 10.1103/physrevapplied.16.014040

ISSN: 2331-7019