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Authors: Hamed Pezeshki, Pingzhi Li, Reinoud Lavrijsen, Jos J.G.M. Van Der Tol, Bert Koopmans
Journal title: IEEE Xplore
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/jqe.2022.3224782
ISSN: 1558-1713