Ab initio modeling of transport and thermodynamic stability for hafnia memristive devices

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Authors: Xiaoliang Zhong, Ivan Rungger, Peter Zapol, Olle Heinonen

Journal title: Journal of Computational Electronics

Journal number: 16/4

Journal publisher: Kluwer Academic Publishers

Published year: 2017

Published pages: 1066-1076

DOI identifier: 10.1007/s10825-017-1043-2

ISSN: 1569-8025