SIMPLE: Structured illumination based point localization estimator with enhanced precision

Summary

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Authors: Reymond, Loic; Ziegler, Johannes; Knapp, Christian; Wang, Fung-Chen; Huser, Thomas; Ruprecht, Verena; Wieser, Stefan

Journal title: OPTICS EXPRESS

Journal number: volume 27, issue 17

Journal publisher: Optical Society of America

Published year: 2019

DOI identifier: 10.1364/oe.27.024578

ISSN: 1094-4087