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Authors: Michael Hartmann, Hernan Abaunza, Pedro Castillo, Michael Stolz, Daniel Watzenig
Journal title: 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-6
DOI identifier: 10.1109/i2mtc.2018.8409536
ISBN: 978-1-5386-2222-3