Security and reliability performance of noise-loop modulation: theoretical analysis and experimentation

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Authors: L. Mucchi, S. Caputo, P. Marcocci, G. Chisci, L. Ronga, and E. Panayrci

Journal title: IEEE Transactions on Vehicular Technology ( Volume: 71, Issue: 6, June 2022)

Journal number: 23 March 2022

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2022

Published pages: 6335 - 6350

DOI identifier: 10.1109/tvt.2022.3160094

ISSN: 0018-9545