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Authors: Robin Schmidt, Dominique Schreurs, Michael Dieudonne, Pawel Barmuta
Journal title: 2020 95th ARFTG Microwave Measurement Conference (ARFTG)
Journal publisher: IEEE
Published year: 2020
Published pages: 1-3
DOI identifier: 10.1109/arftg47271.2020.9241363
ISBN: 978-1-7281-0951-0
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