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Authors: Andreas Rennings, Benedikt Sievert, Wanjiao Liu, Khaled Arzi, Werner Prost, Daniel Erni
Journal title: 2017 IEEE Asia Pacific Microwave Conference (APMC)
Journal publisher: IEEE
Published year: 2017
Published pages: 775-778
DOI identifier: 10.1109/apmc.2017.8251563
ISBN: 978-1-5386-0640-7