There is Plenty of Room for THz Tunneling Electron Devices Beyond the Transit Time Limit

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Authors: Matteo Villani; Simone Clochiatti; Werner Prost; Nils Weimann; Xavier Oriols

Journal title: IEEE Electron Device Letters Feb. 2021

Journal number: Vol. 42, Num. 2

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: pp. 224 - 227

DOI identifier: 10.1109/led.2021.3049229

ISSN: 0741-3106