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Authors: Cimbri, D. , Yavas-Aydin, B., Hartmann, F., Jabeen, F., Worschech, L., Höfling, S. and Wasige, E.
Journal title: IEEE Transactions on Electron Devices
Journal number: vol. 69, no. 8, pp. 4638-4645
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/ted.2022.3178360
ISSN: 0018-9383