Noise and Charge Discreteness as Ultimate Limit for the THz Operation of Ultra-Small Electronic Devices

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Authors: Enrique Colomes, Xavier Oriols, Javier Mateos, Tomas Gonzalez

Journal title: 2018 Spanish Conference on Electron Devices (CDE)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-4

DOI identifier: 10.1109/cde.2018.8597135

ISBN: 978-1-5386-5779-9