Photoluminescence excitation spectroscopy for structural and electronic characterization of resonant tunneling diodes for THz applications

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Authors: M. Cito; O. Kojima; B. J. Stevens; T. Mukai; R. A. Hogg

Journal title: AIP Advances, Vol 11, Iss 3, Pp 035122-035122-5 (2021)

Journal number: 4

Journal publisher: American Institute of Physics Inc.

Published year: 2021

DOI identifier: 10.1063/5.0035394

ISSN: 2158-3226