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Authors: E. Metral, T. Argyropoulos, H. Bartosik, N. Biancacci, X. Buffat, J. F. Esteban Muller, W. Herr, G. Iadarola, A. Lasheen, K. Li, A. Oeftiger, T. Pieloni, D. Quartullo, G. Rumolo, B. Salvant, M. Schenk, E. Shaposhnikova, C. Tambasco, H. Timko, C. Zannini, A. Burov, D. Banfi, J. Barranco, N. Mounet, O. Boine-Frankenheim, U. Niedermayer, V. Kornilov, S. White
Journal title: IEEE Transactions on Nuclear Science
Journal number: 63/2
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2016
Published pages: 1001-1050
DOI identifier: 10.1109/TNS.2015.2513752
ISSN: 0018-9499
- Not specified