Comments on ``Study of Systematic Bias in Measuring Surface Deformation With SAR Interferometry''

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Authors: Claudio De Luca; Francesco Casu; Michele Manunta; Giovanni Onorato; Riccardo Lanari

Journal title: info:cnr-pdr/source/autori:De Luca C.; Casu F.; Manunta M.; Onorato G.; Lanari R./titolo:Comments on ``Study of Systematic Bias in Measuring Surface Deformation With SAR Interferometry''/doi:10.1109%2FTGRS.2021.3103037/rivista:IEEE transactions on geoscience and remote sensing/anno:2021/pagina_da:/pagina_a:/intervallo_pagine:/volume:

Journal number: 11

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.36227/techrxiv.14691333.v1