Measurement of charge density in nanoscale materials using off-axis electron holography

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Authors: Fengshan Zheng, Jan Caron, Vadim Migunov, Marco Beleggia, Giulio Pozzi, Rafal E. Dunin-Borkowski

Journal title: Journal of Electron Spectroscopy and Related Phenomena

Journal number: 241

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 146881

DOI identifier: 10.1016/j.elspec.2019.07.002

ISSN: 0368-2048