High resolution crystal orientation mapping of ultrathin films in SEM and TEM

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Authors: Heinig M. F., Chatterjee D., van Helvoort A. T.J., Wagner J. B., Kadkhodazadeh S., Ånes H. W., Niessen F., and Bastos da Silva Fanta A

Journal title: Materials Characterization

Journal publisher: Pergamon Press Ltd.

Published year: 2022

Published pages: 111931

DOI identifier: 10.1016/j.matchar.2022.111931

ISSN: 0346-251X