Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope

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Authors: Thomas Riedel, Peter Hartel, Martin Linck, Volker Gerheim, Heiko Müller and Stephan Uhlemann

Journal title: Microscopy and Microanalysis

Journal publisher: Cambridge University Press

Published year: 2020

DOI identifier: 10.1017/s1431927620020619

ISSN: 1431-9276