Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations

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Authors: Annelies De wael, Annick De Backer, Sandra Van Aert

Journal title: Ultramicroscopy

Journal publisher: Elsevier BV

Published year: 2020

DOI identifier: 10.1016/j.ultramic.2020.113131

ISSN: 0304-3991