Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science

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Authors: Gao, C; Hofer, C; Jannis, D; Beche, A; Verbeeck, J; Pennycook, TJ

Journal title: APPLIED PHYSICS LETTERS

Journal publisher: AIP PUBLISHING

Published year: 2022

Published pages: 6

DOI identifier: 10.1063/5.0101895

ISSN: 1551-7616