Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-ray Spectroscopy

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Authors: De Backer, A; Zhang, ZZ; van den Bos, KHW; Bladt, E; Sanchez-Iglesias, A; Liz-Marzan, LM; Nellist, PD; Bals, S; Van Aert, S

Journal title: SMALL METHODS

Journal publisher: WILEY-V C H VERLAG GMBH

Published year: 2022

Published pages: 2200875

DOI identifier: 10.1002/smtd.202200875

ISSN: 2702-4288