On the Benefit of Aberration Correction in Cryo Electron Microscopy

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Authors: Martin Linck, Heiko Müller, Peter Hartel, Svenja Perl, Stephan Uhlemann and Max Haider

Journal title: Microscopy and Microanalysis

Journal publisher: Cambridge University Press

Published year: 2020

DOI identifier: 10.1017/s1431927620020644

ISSN: 1431-9276