HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: V. Prabhakara, D. Jannis, G. Guzzinati, A. Béché, H. Bender, J.Verbeeck

Journal title: Ultramicroscopy

Journal publisher: Elsevier BV

Published year: 2020

DOI identifier: 10.1016/j.ultramic.2020.113099

ISSN: 0304-3991