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Authors: Y. Eren Suyolcu, Federico Baiutti, Yi Wang, Wilfried Sigle, Georg Christiani, Gennady Logvenov, Joachim Maier and Peter van Aken
Journal title: Microscopy and Microanalysis
Journal publisher: Cambridge University Press
Published year: 2020
DOI identifier: 10.1017/s1431927620015688
ISSN: 1431-9276
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