Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process

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Authors: Jannis, D; Velazco, A; Beche, A; Verbeeck, J

Journal title: ULTRAMICROSCOPY

Journal publisher: Pergamon Press Ltd.

Published year: 2022

Published pages: 113568

DOI identifier: 10.1016/j.ultramic.2022.113568

ISSN: 0346-251X