Aberration-corrected transmission electron microscopy with Zernike phase plates

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Authors: Simon Hettler, Raúl Arenal

Journal title: Ultramicroscopy

Journal publisher: Pergamon Press Ltd.

Published year: 2022

Published pages: Volume 239, 113564

DOI identifier: 10.1016/j.ultramic.2022.113564

ISSN: 0346-251X