Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?

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Authors: Ibanez, FV; Beche, A; Verbeeck, J

Journal title: MICROSCOPY AND MICROANALYSIS

Journal publisher: CAMBRIDGE UNIV PRESS

Published year: 2022

Published pages: 1-10

DOI identifier: 10.1017/s1431927622012260

ISSN: 1435-8115