High-resolution Analytical STEM of Defects and Interfaces in Beam-sensitive Ultra-thin Cuprate Films

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Vesna Srot, Yi Wang, Matteo Minola, Ute Salzberger, Marco Salluzzo, Gabriella Maria De Luca, Bernhard Keimer and Peter van Aken

Journal title: Microscopy and Microanalysis

Journal publisher: Cambridge University Press

Published year: 2020

DOI identifier: 10.1017/s1431927620023387

ISSN: 1431-9276